| Deutschen Institut für Normung |
DIN 43760: 1980 |
0.003850 |
100 |
| International Electrotechnical Commission |
IEC 751: 1995 (Amend. 2) |
0.00385055 |
100 |
| Scientific Apparatus Manufacturers of America |
SAMA RC-4-1966 |
0.003923 |
98.129 |
| American Society for Testing and Materials |
ASTM E1137 |
0.00385055 |
100 |